Lichttechnisches Institut
LTI

M.Sc. Yidenekachew Donie

  • Engesserstrasse 13, Geb. 30.34
    76131 Karlsruhe

Publikationen


2020
Compensated Microsphere-Assisted Interference Microscopy.
Perrin, S.; Donie, Y. J.; Montgomery, P.; Gomard, G.; Lecler, S.
2020. Physical review applied, 13 (1), Art.-Nr. 014068. doi:10.1103/PhysRevApplied.13.014068
Nanostructured front electrodes for perovskite/c-Si tandem photovoltaics.
Hossain, I. M.; Donie, Y. J.; Schmager, R.; Abdelkhalik, M. S.; Rienäcker, M.; Wietler, T. F.; Peibst, R.; Karabanov, A.; Schwenzer, J. A.; Moghadamzadeh, S.; Lemmer, U.; Richards, B. S.; Gomard, G.; Paetzold, U. W.
2020. Optics express, 28 (6), 8878–8897. doi:10.1364/OE.382253
2018
Light trapping in thin film silicon solar cells via phase separated disordered nanopillars.
Donie, Y. J.; Smeets, M.; Egel, A.; Lentz, F.; Preinfalk, J. B.; Mertens, A.; Smirnov, V.; Lemmer, U.; Bittkau, K.; Gomard, G.
2018. Nanoscale, 10 (14), 6651–6659. doi:10.1039/C8NR00455B
2017
Bioinspired phase-separated disordered nanostructures for thin photovoltaic absorbers.
Siddique, R. H.; Donie, Y. J.; Gomard, G.; Yalamanchili, S.; Merdzhanova, T.; Lemmer, U.; Hölscher, H.
2017. Science advances, 3 (10), e1700232. doi:10.1126/sciadv.1700232
2016
Light Management in Thin Film Solar Cells using Internal Scattering Layers made by Polymer Blend Lithography.
Donie, Y. J.; Smeets, M.; Smirnov, V.; Preinfalk, J. B.; Egel, A.; Lemmer, U.; Bittkau, K.; Gomard, G.
2016. Optical Nanostructures and Advanced Materials for Photovoltaics 2016, Leipzig, 14.-17. November 2016, PTh2A.6, Optical Society of America, Washington, DC. doi:10.1364/PV.2016.PTh2A.6
Accurate Modeling of Outcoupling from OLEDs: Volumetric versus Flat Internal Scattering Layers.
Egel, A.; Theobald, D.; Donie, Y. J.; Preinfalk, J. B.; Gomard, G.; Lemmer, U.
2016. Solid-State Lighting 2016, Leipzig, 14.-17. November 2016, SSW2D.3, Optical Society of America, Washington, DC. doi:10.1364/SSL.2016.SSW2D.3
Light scattering by oblate particles near planar interfaces: on the validity of the T-matrix approach.
Egel, A.; Theobald, D.; Donie, Y.; Lemmer, U.; Gomard, G.
2016. Optics express, 24 (22), 25154–25168. doi:10.1364/OE.24.025154