Patrick Beu
- Masterstudent
- Spatially resolved defect characterization and quality determination of epitaxially grown kerfless silicon wafers for solar cells
- Betreuung:
Prof. Dr. rer. nat. Uli Lemmer
Dr. Martin Schubert, Fraunhofer ISE
Prof. Dr. rer. nat. Uli Lemmer
Dr. Martin Schubert, Fraunhofer ISE