Optical metrology using a 3-layer CMOS image sensor
| Chair: | Vortrag Diplomarbeit | ||
|---|---|---|---|
| Place: | LTI-Hörsaal | ||
| Date: | Montag, 22.11.10 | ||
| Speaker: | Raik Schnabel | ||
| Time: | 14:00 Uhr | ||
last change:
2010-10-01
KIT – University of the State of Baden-Wuerttemberg and National Research Center of the Helmholtz Association